Covers techniques for determining composition, degree of perfection, physical and mechanical traits, & microstructure of materials. Includes articles on the characterization of specific materials and general techniques. Covers bulk methods and surface techniques, including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques.

Location: WALTER Sci/Eng Reference TA402 .C659 1992

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